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Constant Signal Generator DOWNLOAD NOW 1,520 downloads so far. Constant signal An Audacity plugin that add an ouput DC offset. Constant Signal Generator DOWNLOAD NOW 1,520 downloads so far. Constant signal An Audacity plugin that add an ouput DC offset. Description Free Download.

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Constant Signal Generator 2025 - Download

EngineeringElectrical EngineeringElectrical Engineering questions and answersIn this experiment, why do we need to keep the amplitude of theoutput voltage of the signal generator constant?This problem has been solved!You'll get a detailed solution from a subject matter expert that helps you learn core concepts.See AnswerQuestion: In this experiment, why do we need to keep the amplitude of theoutput voltage of the signal generator constant?In this experiment, why do we need to keep the amplitude of theoutput voltage of the signal generator constant? Show transcribed image textHere’s the best way to solve it.​​​​ This is a experiment on series RLC resonance. Resonance - It is phenomenon in which maximum current flows through the circuit at a certain frequency. That frequency is called resonance frequency. At resonance impedance of the circu…View the full answerPrevious question Next questionTranscribed image text: A Signal Gegjerator 1 1 1 1 Y, R=192 С C Oscilloscope Fig. 3 Circuit for experiment L=0.11 C=0.1uF 10= RL=68.62 fo=1.591KHz(calculation value) before the resonance at the resonance after the resonance I (mA) 0.29 0.36 0.45 0.57 0.71 0.93 1.24 1.8 ZUUR 2688/31 TD 188.Bus! Agilent Technologies DSO1022A Oscilloscope TD 200.Bus! 2GSa/s 200MHz 2GSa/s Ono [email protected] TD 180.Bus 2.800 00.000 Push 3.03 f (Hz) 600 700 800 900 1k 1.1k 1.2k 1.3k 1.4k 1.545k 1.6k 1.7k 1.8k 1.9k 2.Ok 2.1k 2.2k 2.3k 2.4k Uppe 2.00u Up: 1.9200 CHE 520UE) 2.BOMU UPP 2.000 Upp24.200 E 500ml CH25.60UT Free 1.55kHz Uppe 2.000 Up 3.2 CHE 500MURERE.BURU Freu2.40kHz Free 7.46 5.93 3.35 2.24 1.68 1.33 1.11 0.96 0.83 0.74 Instruction list I00.01 PP00.01 PP00.01 O00.01 Signal course T = 1 cycle Behaviour of the progr. pulses after switching the controller on After switching the controller on (or after a RESET), the pulse has to be passed once at a value of 0 as the function cannot be guaranteed otherwise. Page 120: Pulse With Positive Signal Examples As opposed to the programmable pulses (see above) which are activated by edge reversals, the signal status is evaluated in the following two examples. This causes a different behavior when switching the control on. 6.7.3. Pulse with positive signal Circuit diagram Switching symbol Instruction list... Page 121: Pulse With Negative Signal Examples 6.7.4. Pulse with negative signal Circuit diagram Switching symbol Instruction list I00.03 SM15.14 M00.01 O00.03 SM15.14 M00.01 Signal course T = 1 cycle 6 - 19... Page 122: Software Timers Examples 6.8. Software timers 6.8.1. Impulse at startup Circuit diagram Switching symbol Instruction list L I00.01 = PT00.01:135*10ms:P L PT00.01 = O00.01 Signal course T= Time preselection (here: 1.35s) 6 - 20... Page 123: Impulse With Constant Duration Examples 6.8.2. Impulse with constant duration Circuit diagram Switching symbol Instruction list L I00.02 O PT00.02 = PT00.02:123*100ms:P L PT00.02 = O00.02 Signal course T= Time preselection (here: 12.3s) 6 - 21... Page 124: Raising Delay Examples 6.8.3. Raising delay Switching symbol Instruction list L I00.03 = PT00.03:185*10ms:R L PT00.03 = O00.03 Signal course T= Time preselection (here: 1.85s) 6 - 22... Page 125: Falling Delay Examples 6.8.4. Falling delay Switching symbol Instruction list L I00.04 = PT00.04:35*100ms:F L PT00.04 = O00.04 Signal course T= Time preselection (here: 3.5s) 6 - 23... Page 126: Impulse Generator With Pulse Output Examples 6.8.5. Impulse generator with pulse output Switching symbol Instruction list I00.05 O00.05 PT00.05:55*10ms:R PT00.05 O00.05 Signal course T1= Time preselection (here: 0.55s) T2=

Constant Signal Generator 2025 - Download, Screenshots

Each attenuator introduces errors. While you output extremely low amplitude signals, the internally-generated system noise of a signal generator becomes critical. The lower the system noise floor, the higher the signal-to-noise ratio (SNR). Lower SNR results in a poor receiver sensitivity measurement. In addition to the system noise floor, interfering signals can be a source of errors for extremely low amplitude signals. To resolve the errors, place the device under test (DUT) in a shielded environment. Beyond the Output Range RF signal generators are capable of outputting as high as +25 dBm and as low as -120 dBm. If you need to go beyond the specified range, you can use an amplifier to increase the output power or an attenuator to decrease it. When you extend the output range of the signal generator, there are some important factors to be aware of. Amplifier gain uncertainty affects the output amplitude level Attenuator’s flatness and accuracy performance Tips for Optimizing Amplitude Accuracy There are several ways to optimize amplitude accuracy while you use an external amplifier or an attenuator (or other passive accessories) with a signal generator. The common method is to use a vector network analyzer (VNA) to measure the entire signal path and enter correction values into the signal generator. Below are 2 tips to improve amplitude accuracy easily by using the built-in capabilities of new signal generators. Tip 1: Using Flatness Correction User flatness correction allows the digital adjustment of RF output amplitude to compensate for external losses in cables, switches, or other devices. By using power meter/sensor to calibrate the measurement system, a table of power level corrections can automatically be created. The USB power sensor connects to the signal generator directly. The signal generator works as a power meter and measures the power at the test plane. The correction values can be saved in the signal generator’s memory and you can recall and apply the correction values the next time you use the same test configuration. Figure 2 below illustrates the flatness correction setup by using a signal generator and USB power sensor. Figure 2: Flatness correction by using USB power sensor Tip 2: Using External Leveling External leveling lets you move the ALC feedback source closer to the DUT so that it accounts for most of the power uncertainties inherent to the cabling and components in a test setup. Figure 3: Test setup for external leveling As the RF power level at the input of the power coupler/splitter changes, the external detector returns a compensating negative voltage. The ALC circuit uses this negative voltage to level the RF output power by raising or lowering the signal generator’s power. This ensures a constant power level at the. Constant Signal Generator DOWNLOAD NOW 1,520 downloads so far. Constant signal An Audacity plugin that add an ouput DC offset. Constant Signal Generator DOWNLOAD NOW 1,520 downloads so far. Constant signal An Audacity plugin that add an ouput DC offset. Description Free Download.

Constant Current Generator - Signal Generators - AliExpress

PULSE_GEN / PULSE_GEN_S - Pulse Generator This pulse generator function block generates a pulse signal with a configurable pulse/pause ratio. The pulse/pause ratio is set using the function block inputs PTH and PTL. The generated pulse signal can be used to control other safety-related and standard functions/function blocks. NOTE: The pulse generator function block is available twice: as standard version (PULSE_GEN) with formal parameters of standard data types and as safety-related version (PULSE_GEN_S) with formal parameters of safety-related data types. In the sections below, always Boolean states TRUE/FALSE are mentioned. Correspondingly, the Safeboolean states SAFETRUE/SAFEFALSE apply for the safety-related PULSE_GEN_S version. WARNING UNINTENDED EQUIPMENT OPERATION Verify that the connection of the pulse signal generated by PULSE_GEN/PULSE_GEN_S cannot lead to undesirable behavior of the safety-related application.1 Failure to follow these instructions can result in death, serious injury, or equipment damage. 1 This could occur, for example, if the Q output of the PULSE_GEN FB is connected to the Reset input of a safety-related function block, thereby causing potentially hazardous cyclic resetting. This topic contains information on the following: Description of formal parameters Exception avoidance Timing diagram Application example Formal parameters of PULSE_GEN/PULSE_GEN_S Parameter Data types Description IN BOOL (standard FB) SAFEBOOL (safety-related FB) State-controlled input for activating the FB. Connect this input to a TRUE constant or a Boolean/Safeboolean input signal: TRUE The FB is activated, the time inputs PTH and PTL are evaluated, and the pulse signal is output accordingly at Q. NOTE: The Q output is set to TRUE * 1993-04-02 1994-11-09 Nec Corporation Semiconductor synchronous memory device having input circuit for producing constant main control signal operative to allow timing generator to latch command signals EP0640986A1 (en) * 1993-08-26 1995-03-01 Siemens Aktiengesellschaft Semiconductor memory device and method for testing the same Cited By (7) * Cited by examiner, † Cited by third party Publication number Priority date Publication date Assignee Title US7260020B2 (en) 2002-03-19 2007-08-21 Broadcom Corporation Synchronous global controller for enhanced pipelining US8693279B2 (en) 2002-03-19 2014-04-08 Broadcom Corporation Synchronous global controller for enhanced pipelining US9159385B2 (en) 2002-03-19 2015-10-13 Broadcom Corporation Memory architecture with local and global control circuitry US9542997B2 (en) 2002-03-19 2017-01-10 Broadcom Corporation Memory architecture with local and global control circuitry EP1376596A2 (en) * 2002-06-21 2004-01-02 Broadcom Corporation Synchronous global controller for enhanced pipeline EP1585137A1 (en) * 2002-06-21 2005-10-12 Broadcom Corporation Synchronous global controller for enhanced pipelining EP1376596B1 (en) * 2002-06-21 2008-01-09 Broadcom Corporation Synchronous global controller for enhanced pipeline Similar Documents Publication Publication Date Title US6894547B2 (en) 2005-05-17 Output buffer circuit and integrated semiconductor circuit device with such output buffer circuit US6081462A (en) 2000-06-27 Adjustable delay circuit for setting the speed grade of a semiconductor device US20050104640A1 (en) 2005-05-19 Apparatus and method for duty cycle correction DE19503390C2 (en) 1997-02-27 Data output buffer control circuit US20020050847A1 (en) 2002-05-02 Semiconductor device with dummy interface circuit JP3917217B2 (en) 2007-05-23 Initialization circuit for semiconductor memory device US6339353B1 (en) 2002-01-15 Input circuit of a memory having a lower current dissipation JPH1079191A (en) 1998-03-24 Internal step-up-voltage generator for semiconductor storage device US6333875B1 (en) 2001-12-25 Semiconductor circuit with adjustment of double data rate data latch timings US6023181A (en) 2000-02-08 High speed unitransition input buffer KR100425446B1 (en) 2004-03-30 A input circuit of semiconductor memory device including clock selection circuit for selecting predetermined clock signal to be calibrated and the method thereof US6239642B1 (en) 2001-05-29 Integrated circuits with variable signal line loading circuits and methods of operation thereof KR100581444B1 (en) 2006-07-25 Apparatus for controlling circuit response during power-up WO1998036417A1 (en) 1998-08-20 Clock doubler and minimum duty cycle generator for sdrams US5982188A (en) 1999-11-09 Test mode control circuit of an integrated circuit device KR100267088B1 (en) 2000-10-02 Reference voltage generator of a semiconductor memory device KR0167680B1 (en) 1999-02-01 Internal power supply voltage generation circuit of semiconductor memory device JPH0758887B2 (en) 1995-06-21 Variable clock delay circuit using RC time constant KR0119886B1 (en) 1997-10-17 Mode setting circuit of semiconductor memory device and method thereof US5550500A (en) 1996-08-27 Timing delay modulation scheme for integrated circuits JP3434741B2 (en) 2003-08-11 Semiconductor storage device US6868018B2 (en) 2005-03-15 Memory circuit, method for manufacturing and method for operating the same KR100596852B1 (en) 2006-07-04 Internal Clock Signal Generator KR100213222B1 (en) 1999-08-02 Row Address Signal Control Circuit of Semiconductor Memory Device KR100308071B1 (en) 2001-10-19 Precharge Device

Generating SPWM signal Triangular signal and Constant which

Generating a third transition in the derived clock signal based on a second transition in the external clock signal; internally generating a second pulse (LTTME) having a transition separated in time from a transition in said first pulse; generating a fourth transition in the derived clock signal based on a transition in said second pulse; generating a fifth transition in the derived clock signal based on a third transition in the external clock signal, whereby the derived clock signal experiences five transitions that correspond to the timing of three transition of the external clock signal and the duration of said pulses is programmable. 3. The method of claim 2 further comprising operating the clock signal without doubling its frequency by: generating a first transition in the derived clock signal based on said first transition of the external clock signal; generating another pulse; holding the voltage level of the derived clock signal based on said another pulse; generating a second transition in the derived clock signal based on said another pulse; and generating a third transition in the derived clock signal based on a third transition in the external clock signal. PCT/JP1997/000376 1997-02-13 1997-02-13 Clock doubler and minimum duty cycle generator for sdrams WO1998036417A1 (en) Priority Applications (1) Application Number Priority Date Filing Date Title PCT/JP1997/000376 WO1998036417A1 (en) 1997-02-13 1997-02-13 Clock doubler and minimum duty cycle generator for sdrams Applications Claiming Priority (1) Application Number Priority Date Filing Date Title PCT/JP1997/000376 WO1998036417A1 (en) 1997-02-13 1997-02-13 Clock doubler and minimum duty cycle generator for sdrams Publications (1) Publication Number Publication Date WO1998036417A1 true WO1998036417A1 (en) 1998-08-20 Family ID=14180039 Family Applications (1) Application Number Title Priority Date Filing Date PCT/JP1997/000376 WO1998036417A1 (en) 1997-02-13 1997-02-13 Clock doubler and minimum duty cycle generator for sdrams Country Status (1) Country Link WO (1) WO1998036417A1 (en) Cited By (1) * Cited by examiner, † Cited by third party Publication number Priority date Publication date Assignee Title EP1376596A2 (en) * 2002-06-21 2004-01-02 Broadcom Corporation Synchronous global controller for enhanced pipeline Citations (3) * Cited by examiner, † Cited by third party Publication number Priority date Publication date Assignee Title EP0514017A2 (en) * 1991-04-25 1992-11-19 Oki Electric Industry Co., Ltd. Serial access memory EP0623931A2 (en) * 1993-04-02 1994-11-09 Nec Corporation Semiconductor synchronous memory device having input circuit for producing constant main control signal operative to allow timing generator to latch command signals EP0640986A1 (en) * 1993-08-26 1995-03-01 Siemens Aktiengesellschaft Semiconductor memory device and method for testing the same 1997 1997-02-13 WO PCT/JP1997/000376 patent/WO1998036417A1/en unknown Patent Citations (3) * Cited by examiner, † Cited by third party Publication number Priority date Publication date Assignee Title EP0514017A2 (en) * 1991-04-25 1992-11-19 Oki Electric Industry Co., Ltd. Serial access memory EP0623931A2 (en)

A constant frequency signal from a signal generator is fed to

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A constant frequency signal from a signal generator is fed to two

Category: Developer Tools / Specialized Tools | Author: Virtins Technology It consists of a signal generator and an off-line oscilloscope. It provides sine, square, triangle, saw tooth,white noise, pink noise, multi-tones, arbitrary wave form generation including sweep function. DOWNLOAD GET FULL VER Cost: $24.95 USD License: Shareware Size: 293.0 KB Download Counter: 26 VIRTINS Pocket Signal Generator is a powerful Pocket PC based virtual instrument. It consists of a Signal Generator and an off-line Oscilloscope. 1. The dual channel Signal Generator (Sweep/Arbitrary/Function Generator) provides the following types of waveform for output: (1) Sine (2) Square (3) Triangle (4) Saw Tooth (5) White Noise (6) Pink Noise (7) Multi-tones (8) Arbitrary via user-configurable waveform library at either a fixed frequency, or a frequency that sweeps linearly or logarithmically within specified frequency range and time duration. 2. The dual-channel off-line Oscilloscope provides four types of views: (1) Waveform display of Channel A and Channel B (2) Waveform display of Channel A + Channel B (3) Waveform display of Channel A - Channel B (4) Lissajous Pattern display for Channel A and Channel B The off-line Oscilloscope can be used to view the signal generated by the Signal Generator. It can also be used to view the WAV files recorded by other sound recording software. Requirements: Pocket PC 2002 or above with ARM/XScale CPU OS Support: Pocket PC, Windows Mobile 2003,Windows Mobile 2005 Language Support: English, Chinesesimplified, Chinese Released: December 05, 2005 | Added: February 08, 2008 | Viewed: 4964

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User9885

EngineeringElectrical EngineeringElectrical Engineering questions and answersIn this experiment, why do we need to keep the amplitude of theoutput voltage of the signal generator constant?This problem has been solved!You'll get a detailed solution from a subject matter expert that helps you learn core concepts.See AnswerQuestion: In this experiment, why do we need to keep the amplitude of theoutput voltage of the signal generator constant?In this experiment, why do we need to keep the amplitude of theoutput voltage of the signal generator constant? Show transcribed image textHere’s the best way to solve it.​​​​ This is a experiment on series RLC resonance. Resonance - It is phenomenon in which maximum current flows through the circuit at a certain frequency. That frequency is called resonance frequency. At resonance impedance of the circu…View the full answerPrevious question Next questionTranscribed image text: A Signal Gegjerator 1 1 1 1 Y, R=192 С C Oscilloscope Fig. 3 Circuit for experiment L=0.11 C=0.1uF 10= RL=68.62 fo=1.591KHz(calculation value) before the resonance at the resonance after the resonance I (mA) 0.29 0.36 0.45 0.57 0.71 0.93 1.24 1.8 ZUUR 2688/31 TD 188.Bus! Agilent Technologies DSO1022A Oscilloscope TD 200.Bus! 2GSa/s 200MHz 2GSa/s Ono [email protected] TD 180.Bus 2.800 00.000 Push 3.03 f (Hz) 600 700 800 900 1k 1.1k 1.2k 1.3k 1.4k 1.545k 1.6k 1.7k 1.8k 1.9k 2.Ok 2.1k 2.2k 2.3k 2.4k Uppe 2.00u Up: 1.9200 CHE 520UE) 2.BOMU UPP 2.000 Upp24.200 E 500ml CH25.60UT Free 1.55kHz Uppe 2.000 Up 3.2 CHE 500MURERE.BURU Freu2.40kHz Free 7.46 5.93 3.35 2.24 1.68 1.33 1.11 0.96 0.83 0.74

2025-04-22
User9635

Instruction list I00.01 PP00.01 PP00.01 O00.01 Signal course T = 1 cycle Behaviour of the progr. pulses after switching the controller on After switching the controller on (or after a RESET), the pulse has to be passed once at a value of 0 as the function cannot be guaranteed otherwise. Page 120: Pulse With Positive Signal Examples As opposed to the programmable pulses (see above) which are activated by edge reversals, the signal status is evaluated in the following two examples. This causes a different behavior when switching the control on. 6.7.3. Pulse with positive signal Circuit diagram Switching symbol Instruction list... Page 121: Pulse With Negative Signal Examples 6.7.4. Pulse with negative signal Circuit diagram Switching symbol Instruction list I00.03 SM15.14 M00.01 O00.03 SM15.14 M00.01 Signal course T = 1 cycle 6 - 19... Page 122: Software Timers Examples 6.8. Software timers 6.8.1. Impulse at startup Circuit diagram Switching symbol Instruction list L I00.01 = PT00.01:135*10ms:P L PT00.01 = O00.01 Signal course T= Time preselection (here: 1.35s) 6 - 20... Page 123: Impulse With Constant Duration Examples 6.8.2. Impulse with constant duration Circuit diagram Switching symbol Instruction list L I00.02 O PT00.02 = PT00.02:123*100ms:P L PT00.02 = O00.02 Signal course T= Time preselection (here: 12.3s) 6 - 21... Page 124: Raising Delay Examples 6.8.3. Raising delay Switching symbol Instruction list L I00.03 = PT00.03:185*10ms:R L PT00.03 = O00.03 Signal course T= Time preselection (here: 1.85s) 6 - 22... Page 125: Falling Delay Examples 6.8.4. Falling delay Switching symbol Instruction list L I00.04 = PT00.04:35*100ms:F L PT00.04 = O00.04 Signal course T= Time preselection (here: 3.5s) 6 - 23... Page 126: Impulse Generator With Pulse Output Examples 6.8.5. Impulse generator with pulse output Switching symbol Instruction list I00.05 O00.05 PT00.05:55*10ms:R PT00.05 O00.05 Signal course T1= Time preselection (here: 0.55s) T2=

2025-04-12
User3755

Each attenuator introduces errors. While you output extremely low amplitude signals, the internally-generated system noise of a signal generator becomes critical. The lower the system noise floor, the higher the signal-to-noise ratio (SNR). Lower SNR results in a poor receiver sensitivity measurement. In addition to the system noise floor, interfering signals can be a source of errors for extremely low amplitude signals. To resolve the errors, place the device under test (DUT) in a shielded environment. Beyond the Output Range RF signal generators are capable of outputting as high as +25 dBm and as low as -120 dBm. If you need to go beyond the specified range, you can use an amplifier to increase the output power or an attenuator to decrease it. When you extend the output range of the signal generator, there are some important factors to be aware of. Amplifier gain uncertainty affects the output amplitude level Attenuator’s flatness and accuracy performance Tips for Optimizing Amplitude Accuracy There are several ways to optimize amplitude accuracy while you use an external amplifier or an attenuator (or other passive accessories) with a signal generator. The common method is to use a vector network analyzer (VNA) to measure the entire signal path and enter correction values into the signal generator. Below are 2 tips to improve amplitude accuracy easily by using the built-in capabilities of new signal generators. Tip 1: Using Flatness Correction User flatness correction allows the digital adjustment of RF output amplitude to compensate for external losses in cables, switches, or other devices. By using power meter/sensor to calibrate the measurement system, a table of power level corrections can automatically be created. The USB power sensor connects to the signal generator directly. The signal generator works as a power meter and measures the power at the test plane. The correction values can be saved in the signal generator’s memory and you can recall and apply the correction values the next time you use the same test configuration. Figure 2 below illustrates the flatness correction setup by using a signal generator and USB power sensor. Figure 2: Flatness correction by using USB power sensor Tip 2: Using External Leveling External leveling lets you move the ALC feedback source closer to the DUT so that it accounts for most of the power uncertainties inherent to the cabling and components in a test setup. Figure 3: Test setup for external leveling As the RF power level at the input of the power coupler/splitter changes, the external detector returns a compensating negative voltage. The ALC circuit uses this negative voltage to level the RF output power by raising or lowering the signal generator’s power. This ensures a constant power level at the

2025-04-12
User2413

PULSE_GEN / PULSE_GEN_S - Pulse Generator This pulse generator function block generates a pulse signal with a configurable pulse/pause ratio. The pulse/pause ratio is set using the function block inputs PTH and PTL. The generated pulse signal can be used to control other safety-related and standard functions/function blocks. NOTE: The pulse generator function block is available twice: as standard version (PULSE_GEN) with formal parameters of standard data types and as safety-related version (PULSE_GEN_S) with formal parameters of safety-related data types. In the sections below, always Boolean states TRUE/FALSE are mentioned. Correspondingly, the Safeboolean states SAFETRUE/SAFEFALSE apply for the safety-related PULSE_GEN_S version. WARNING UNINTENDED EQUIPMENT OPERATION Verify that the connection of the pulse signal generated by PULSE_GEN/PULSE_GEN_S cannot lead to undesirable behavior of the safety-related application.1 Failure to follow these instructions can result in death, serious injury, or equipment damage. 1 This could occur, for example, if the Q output of the PULSE_GEN FB is connected to the Reset input of a safety-related function block, thereby causing potentially hazardous cyclic resetting. This topic contains information on the following: Description of formal parameters Exception avoidance Timing diagram Application example Formal parameters of PULSE_GEN/PULSE_GEN_S Parameter Data types Description IN BOOL (standard FB) SAFEBOOL (safety-related FB) State-controlled input for activating the FB. Connect this input to a TRUE constant or a Boolean/Safeboolean input signal: TRUE The FB is activated, the time inputs PTH and PTL are evaluated, and the pulse signal is output accordingly at Q. NOTE: The Q output is set to TRUE

2025-04-15
User9562

* 1993-04-02 1994-11-09 Nec Corporation Semiconductor synchronous memory device having input circuit for producing constant main control signal operative to allow timing generator to latch command signals EP0640986A1 (en) * 1993-08-26 1995-03-01 Siemens Aktiengesellschaft Semiconductor memory device and method for testing the same Cited By (7) * Cited by examiner, † Cited by third party Publication number Priority date Publication date Assignee Title US7260020B2 (en) 2002-03-19 2007-08-21 Broadcom Corporation Synchronous global controller for enhanced pipelining US8693279B2 (en) 2002-03-19 2014-04-08 Broadcom Corporation Synchronous global controller for enhanced pipelining US9159385B2 (en) 2002-03-19 2015-10-13 Broadcom Corporation Memory architecture with local and global control circuitry US9542997B2 (en) 2002-03-19 2017-01-10 Broadcom Corporation Memory architecture with local and global control circuitry EP1376596A2 (en) * 2002-06-21 2004-01-02 Broadcom Corporation Synchronous global controller for enhanced pipeline EP1585137A1 (en) * 2002-06-21 2005-10-12 Broadcom Corporation Synchronous global controller for enhanced pipelining EP1376596B1 (en) * 2002-06-21 2008-01-09 Broadcom Corporation Synchronous global controller for enhanced pipeline Similar Documents Publication Publication Date Title US6894547B2 (en) 2005-05-17 Output buffer circuit and integrated semiconductor circuit device with such output buffer circuit US6081462A (en) 2000-06-27 Adjustable delay circuit for setting the speed grade of a semiconductor device US20050104640A1 (en) 2005-05-19 Apparatus and method for duty cycle correction DE19503390C2 (en) 1997-02-27 Data output buffer control circuit US20020050847A1 (en) 2002-05-02 Semiconductor device with dummy interface circuit JP3917217B2 (en) 2007-05-23 Initialization circuit for semiconductor memory device US6339353B1 (en) 2002-01-15 Input circuit of a memory having a lower current dissipation JPH1079191A (en) 1998-03-24 Internal step-up-voltage generator for semiconductor storage device US6333875B1 (en) 2001-12-25 Semiconductor circuit with adjustment of double data rate data latch timings US6023181A (en) 2000-02-08 High speed unitransition input buffer KR100425446B1 (en) 2004-03-30 A input circuit of semiconductor memory device including clock selection circuit for selecting predetermined clock signal to be calibrated and the method thereof US6239642B1 (en) 2001-05-29 Integrated circuits with variable signal line loading circuits and methods of operation thereof KR100581444B1 (en) 2006-07-25 Apparatus for controlling circuit response during power-up WO1998036417A1 (en) 1998-08-20 Clock doubler and minimum duty cycle generator for sdrams US5982188A (en) 1999-11-09 Test mode control circuit of an integrated circuit device KR100267088B1 (en) 2000-10-02 Reference voltage generator of a semiconductor memory device KR0167680B1 (en) 1999-02-01 Internal power supply voltage generation circuit of semiconductor memory device JPH0758887B2 (en) 1995-06-21 Variable clock delay circuit using RC time constant KR0119886B1 (en) 1997-10-17 Mode setting circuit of semiconductor memory device and method thereof US5550500A (en) 1996-08-27 Timing delay modulation scheme for integrated circuits JP3434741B2 (en) 2003-08-11 Semiconductor storage device US6868018B2 (en) 2005-03-15 Memory circuit, method for manufacturing and method for operating the same KR100596852B1 (en) 2006-07-04 Internal Clock Signal Generator KR100213222B1 (en) 1999-08-02 Row Address Signal Control Circuit of Semiconductor Memory Device KR100308071B1 (en) 2001-10-19 Precharge Device

2025-04-15

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